The following are sorted by reverse chronological order of publication.
4 publications found:
Gervasio, M. T. and Murdock, J. L. What Were You Thinking? Filling in Missing Dataflow Through Inference in Learning from Demonstration, in Proceedings of the 2009 International Conference on Intelligent User Interfaces, 2009. [PDF, Details]
Lowrance, J., Harrison, I., Rodriguez, A., Yeh, E., Boyce, T., Murdock, J., Thomere, J., and Murray, K. Template-Based Structured Argumentationin Knowledge Cartography: Software Tools and Mapping Techniques, Springer, October 2008. [Details]
Murdock, J.L. and Hayes-Roth, B. Intelligent monitoring and control of semiconductor manufacturing equipment. IEEE Expert, vol. 6, no. 6, pp. 19-31, December 1991. [Details]
Murdock, J.L. and Hayes-Roth, B. Intelligent monitoring and diagnosis of semiconductor manufacturing, in Proceedings of the Fifth Annual SRC/DARPA CIM-IC Workshop, August 1990. [Details]
