Publication Details

Symmetry Analysis of Two-Dimensional Patterns for Computer Vision

by Bolles, Robert C.

Technical Note 186
Institution: AI Center, SRI International
Address: 333 Ravenswood Ave, Menlo Park, CA 94025
June 1979.

Note: To be published in the Sixth International Joint Conference on Artificial Intelligence, Tokyo, Japan, 20-23 August 1979. This work was supported by NSF under grant APR75-13074.

Order an AIC Technical Note

Abstract

A system is described that automatically determines the rotational and mirror symmetries of two-dimensional patters. The properties of patterns that determine their symmetries are delineated, a representation scheme based on these properties is defined, and algorithms to perform the symmetry analysis are presented. An implementation based on the SRI vision module is described.

Electronic Copies

Adobe PDF

BibTeX

EndNote

AIC Personnel