Publication Details

Use of Range and Reflectance Data to Find Planar Surface Regions

by Duda, Richard O., Nitzan, David, and Barrett, Phyllis

Technical Note 162
Institution: AI Center, SRI International
Address: 333 Ravenswood Ave, Menlo Park, CA 94025
July 1979.

Note: From IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. PAM-1, No. 3, July 1979. This work was supported by the National Science Foundation under Grant ENG 76-84623.

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This paper describes a sequential procedure for processing registered range and intensity data to detect and extract regions that correspond to planar surfaces in a scene.